Diagnosis of faults on circuit board
CA 1280219 C · Owner: Gonzalez, Roberto · Inventors: Apfelbaum, Lawrence Steven; Gonzalez, Roberto
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A method of determining which of a plurality of electrical devices connected to a node of a circuit under test is causing a failure at that node by causing individual devices to drive the node one device at a time, taking passive voltage measurements at the node at separate times when individual devices are controlled to drive the node, and analyzing measured voltages resulting when different devices are driving the node to identify which is causing the failure.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted February 12, 1991. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended February 12, 2008.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.