Test adapter for integrated circuit carrier

Abstract From the Canadian patent

A test adapter is provided for connection to a PLCC (Plastic Leaded Chip Carrier), hereinafter referred to as a carrier, which assures accurate alignment with the carrier, which can be locked to the carrier during a test, which has a width only slightly greater than that of the carrier to enable testing of closely mounted carriers, and which can be simply constructed. The adapter includes can inner housing that bears against the top of the carrier and four contact frames pivotally mounted on the housing and carrying contacts that engage leads of the carrier. Each contact frame has separators between the contacts the separators passing between the leads of the carrier to directly engage the …