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Expired Canadian patentCanada

Method for the measurement of capacitances, in particular of low capacitances

CA 1268210 C · Owner: Vaisala Oy · Inventors: Lyyra, Matti

CIPO record

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Its claims, description and drawings are in the Canadian Patents Database.

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Abstract From the Canadian patent

A method for the measurement of capacitances particularly low capacitances, utilizes a measurement oscillator having an output frequency which is a function of the capacitance to be connected to the input terminals of the circuit determining the frequency of the oscillator. A known reference capacitance is alternately connected with the capacitance to be measured to, the input terminals of the measurement oscillator via a switching arrangement. The capacitance to be measured and the reference capacitance are connected, alternately one after the other to, the input terminals of the measurement oscillator for the time of an equal number of cycles of the measurement oscillator. The frequency …

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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.

Why it's free to use

  • Granted April 24, 1990. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended April 24, 2007.
  • We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
FiledMay 30, 1985
GrantedApril 24, 1990
Term endedApril 24, 2007
Patent numberCA 1268210 C
Classification (IPC)G01R27/26

Timeline

Timeline From CIPO dates

19861989199219951998200120042007Application filedMay 30, 1985Patent grantedApril 24, 1990Term endedApril 24, 2007

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Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.