Process and apparatus for measuring surface distributions of charged particle emitting radionuclides
CA 1265628 C · Owner: Bolon, Craig · Inventors: Bolon, Craig
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A process for precision measurement of charged particle emissions from a surface and an apparatus for providing a high resolution digital image of the distribution of such emissions in a minimum exposure time over a relatively large surface area. The process of measurement uses the direction of emissions as determined by two or more position measuring elements of an area detector. The apparatus is based on multiple region detector elements that employ proportional amplification of ionization in a gas.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted February 6, 1990. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended February 6, 2007.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.