X-ray examination system and method of controlling an exposure therein
CA 1262191 C · Owner: Spaak, Willem E. · Inventors: Spaak, Willem E.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
An x-ray examination system comprising an x-ray generator an, image intensifier tube connected to an output optical path and an x-ray exposure control arrangement which measures the light image intensity LI at the output of the image intensifier during fluoroscope, and from the relationship derives the exposure value IEXP1 of the switch-on tube current required to provide a desired exposure density during subsequent fluorography with a tube voltage VFL and exposure time TEXP and, wherein LA is a predetermined constant.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted October 3, 1989. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended October 3, 2006.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.