Automatic circuit tester control system
CA 1260536 A · Owner: Teradyne, Inc. · Inventors: Sulman, David L.; Walker, Ernest P.; Van Der Kloot, Robert H.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Apparatus for providing high speed control of digital test patterns and analog instruments in automatic circuit testing apparatus including a sequence controller including a random access memory ("RAM") for microcode and an address generator for selectively addressing instructions in said random access memory, a sequence address bus connected to the address generator of the sequence controller, digital test pattern RAM connected to the sequence address bus, and analog instruments including associated RAM loaded with microcode for the instruments and connected to the sequence address bus.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted September 26, 1989. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended September 26, 2006.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.