Grain damage analyzer
CA 1258127 A · Owner: Deere & Company · Inventors: Bandelow, Vernon D.; Brizgis, Lawrence J.; Keleher, Daniel B.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Abstract of the Disclosure A grain damage analyzer illuminates a grain sample with longwave, ultraviolet radiation, causing the exposed starch of the damaged portions to fluoresce and a video camera views the illuminated grain. The video signal from the camera is digitized into an array of pixels. The number or percentage of pixels which have an intensity exceeding a predetermined threshold represents the extent of damage to the sample.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted August 1, 1989. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended August 1, 2006.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.