Tester for solid state electronic components
CA 1248177 A · Owner: Mulz, Robert H. · Inventors: Mulz, Robert H.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A tester for determining basic electronic and circuit information of solid state components. The tester provides indications in 2- and 3-wire devices of short or open conditions, whether a transistor is NPN or PNP type and whether or not an SCR or triac will latch. Both visual and audible indications are provided and cooperatively provide the indications of component quality.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted January 3, 1989. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended January 3, 2006.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.