Lssd-testable d-type edge-trigger-operable latch with overriding set/reset asynchronous control
CA 1213005 A · Owner: International Business Machines Corporation · Inventors: Moore, Richard P.; Fiedler, Timothy S.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A LSSD testable latch circuit apparatus is disclosed which has systems operational and LSSD testing operational modes. The apparatus is arranged with first and second groups of flip-flops, each group having three flip-flops. Control means allows for selective operation of the first group of flop-flops as a D-type edge triggered latch during the systems operational mode and of the first and and second groups as a three-stage shift register during the LSSD testing operational mode. The control means also allows the D-type edge-triggered latch to have override asynchronously set and/or reset control.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted October 21, 1986. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended October 21, 2003.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.