Hall effect device test circuit
CA 1204161 A · Owner: Gte Automatic Electric Incorporated · Inventors: Daley, William J.; Van Husen, Hendrik W.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted May 6, 1986. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended May 6, 2003.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.