X-y addressable workpiece positioner having an improved x-y address indicia sensor

Abstract From the Canadian patent

In an X-Y addressable workpiece positioner the workpiece, to be positioned, such as a semiconductive wafer to be sequentially exposed at different regions thereof in accordance with a pattern of a mask, is disposed for movement with a work stage along coordinate X and Y axes. The work stage has a two-dimensional array of X and Y coordinate addressing indicia enclosed within a border and affixed to the work stage for movement therewith. A portion of an enlarged image of the array of addressing indicia is projected onto a sensor stage to derive an output indicative of the X and Y coordinates of the array of addressing indicia relative to the position of the sensor stage. The X and Y …