Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
CA 1197323 A · Owner: Thalamus Electronics Inc. · Inventors: Rassem, Mamdouh H.; Slamka, Milan
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Apparatus for the dynamic in-circuit testing of digital electronic devices employs a hardware testing circuit that is set by a microcomputer which takes no direct part in the test so that the test hardware speed is not limited by the computer speed. The apparatus comprises a library of devices corresponding to the devices to be tested, the library including a ROM containing the information regarding the devices needed by the microcomputer for its purpose. An internal interface or router receives signals from the test device that are input signals to its terminals and routes them directly to the corresponding selected device in the library where it becomes an input to that device also. …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted November 26, 1985. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended November 26, 2002.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.