Stress measurement by x-ray diffractometry

Abstract From the Canadian patent

Abstract, The preferred instrument disclosed is a portable X-ray diffractometer for measurement of residual stress in metallic specimens, especially large structures such as, bridges, pipelines etc. The instrument consists of a pair of position sensitive detectors arranged to be mounted in fixed positions relative to the specimen. An X-ray source that projects a collimated incident beam onto the area of the specimen under examination is located between the detectors so that each receives a diffraction line. The source is scanned stepwise in an arc about the specimen area, while the specimen and both the detectors remain fixed. The diffraction lines received in each detector are stored in a …