Temperature pattern measuring method and device therefor
CA 1165444 A · Owner: Sumitomo Kinzoku Kogyo Kabushiki Gaisha · Inventors: Katayama, Yutaka; Hotta, Kazuyuki; Nemoto, Shin
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A temperature pattern measuring method and apparatus by which portions of light from parts of an area of an object the distribution pattern of the temperature of which is to be measured which parts are in a predetermined pattern are passed through, first and second optical filters which pass different wavelengths of light, respectively. The level of energy passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices and using the thus determined energy levels an arith-, metic unit carries out a two-color temperature determining operation for the respective parts of the area for determining the …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted April 10, 1984. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended April 10, 2001.
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Timeline
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Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.