Diode faults detecting apparatus
CA 1162611 A · Owner: Tokyo Shibaura Denki Kabushiki Kaisha · Inventors: Kimura, Yoshinori; Hirai, Katsumi; Kamata, Shohichi
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Abstract of the Disclosure, First and second diodes are formed on the same semiconductor substrate. Both the diodes are forward biased by a direct current power supply. An attenuator is connected to a positive terminal of the first diode to produce an output lower in level than a voltage on the positive terminal of the first diode. A comparator receives the output of the attenuator as a first input and a voltage on a positive terminal of said second diode as a second input. When the first input is smaller than the second input, the comparator produces an output "0". When the first diode is open-circuited and the first input becomes greater than the second input the compara-, tor produces an …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted February 21, 1984. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended February 21, 2001.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.