Integrated circuit arrangement in mos- technology with field effect transistors
CA 1138125 A · Owner: N.V. Philips Gloeilampenfabrieken · Inventors: Hapke, Friedrich
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
1 PHD. 79-011. ABSTRACT:, During the fabrication of integrated circuits testing is necessary in order to enable faults to be located. For this purpose it is known to connect test points to specific points of the circuit which dur-, ing fabrication are accessible with a suitable designed scanner. Owing to the location of the test points smaller blocks are formed in comparison with the complete circuit arrangement. According to the invention transistor switched are included to provide isolation of selected input and output transistor blocks to allow separate testing as well as testing in combination.
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted December 21, 1982. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended December 21, 1999.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.