X-ray analytical system
CA 1111150 A · Owner: Bausch & Lomb, Inc. · Inventors: Smallbone, Allan H.; Gurvich, Yury M.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
An X-ray spectrometer is provided with two channels for detecting characteristic lines of the X-ray source after being scattered by a sample undergoing analysis in addition to means, for detecting electric signals primarily representative of the concentrations of analytes in the sample. In this way data is, collected which facilitates corrections of the measurements corresponding to individual analytes for deviations from linearity of intensity caused by variations in interelement effects and by, variations in total-solids concentration or density, of the, slurry, or matrix, in which the analytes are distributed and by, variations in particle size of the total-solids in the sample. …
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted October 20, 1981. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended October 20, 1998.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.