Method of measuring the amount of substance associated with a material in the presence of a contaminant
CA 1102579 A · Owner: Measurex Corporation · Inventors: Chase, Lee M.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A method of measuring the amount of substance associated with a material in the presence of a contaminant comprises choosing a first band of radiation which lies outside the absorption band of the substance but within the abosrption band of the contaminant. The first band is directed at the material; a first detector is positioned to receive the radiation after impinging the material. The first detector converts the radiation received into a first electrical signal. A second band of radiation which is chosen, to lie within the absorption band of the substance is also within an, absorption band of the contaminant. The second band is directed at the material; a second detector is positioned …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted June 9, 1981. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended June 9, 1998.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.