Semiconductor tester
CA 1093705 A · Owner: Huntron Instruments, Inc. · Inventors: Hunt, Bill
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
Abstract of the Disclosure An apparatus for testing the operating state of single and multiple semiconductor junctions either in, or out of circuit. The tester lncludes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads which are selectively connectable by a switching device to a resistance and voltage divider array, which includes means adapted to receive the junction to be tested. The output of the testing circuit is applied to a display circuit which includes a visual indicator, which in turn produces a trace having a configuration representative of the forward and reverse characteristics of the function for inspection by an …
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted January 13, 1981. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended January 13, 1998.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.