Self-compensating x-ray or gamma ray thickness gauge
CA 1076712 A · Owner: Allport, John J. · Inventors: Allport, John J.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A gauge for determining the mass per unit area or alternatively, the thickness of sheet material by measuring the attenuation as well as back-, scatter, of an X-ray beam or the like while continuously taking into account deviations and changes in localized material composition insofar as these, have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e. nominal composition. The resultant output signal represents the mass per unit area or thickness.
Read the whole patent
Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted April 29, 1980. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended April 29, 1997.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.