Capacitive thickness gauging
CA 1052886 A · Owner: Ade Corporation · Inventors: Poduje, Noel S.; Abbe, Robert C.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
A system for capacitively gauging distance to an element which is not in a low impedance path to ground. The gauging system operates to provide an indication of distance with the potential on the element at a defined level, typically ground. Several embodiments are presented for making this measurement. A first operates to measure distance at periodic instances when the defined potential exists. A second embodiment uses phase opposite excitation to produce a defined potential at the element either by specific placement of the element or through a feedback control over element potential. The system of the present invention may be adapted for use in capacitive thickness measurement on an …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted April 17, 1979. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended April 17, 1996.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.