Method of and device for testing a digital memory
CA 1051556 A · Owner: N.V. Philips Gloeilampenfabrieken · Inventors: Smulders, Adrianus J.; De Jonge, Jan H.
Overview
Its claims, description and drawings are in the Canadian Patents Database.
Open the CIPO recordAbstract From the Canadian patent
The invention provides a compact test sequence for testing integrated memories. First all storage, positions are filled with the information "O". subsequently, in a given order of the addresses the information "O" written for each address is read; immediately thereafter a "1" is written which is immediately tested thereafter by reading again. When the last address of the said order is reached, the "1" is read in the same order for each address, and subsequently a "O" is written, which is finally tested by reading again. When the last address is reached all addresses are, read in the reverse order and a "even" is written which, is tested again. When the first address is reached all addresses …
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Listed from its CIPO record in Patent Yard's archive of Canadian patents past their term. Its claims, description and drawings are in the CIPO record and on Google Patents, and the Claude kit works from them.
Why it's free to use
- Granted March 27, 1979. A Canadian patent filed before October 1, 1989 lasted 17 years from grant, so its term ended March 27, 1996.
- We check Canadian rights only. A patent in its family in another country could still be in force: check its family on Google Patents.
Timeline
Timeline From CIPO dates
Sources & verification
Official CIPO records
Everything on this page comes from the CIPO record linked above. Contains information licensed under the Open Government Licence – Canada.